Sign in
Xampling: analog to digital at sub-Nyquist rates
Journal article   Peer reviewed

Xampling: analog to digital at sub-Nyquist rates

M. Mishali, Y. C. Eldar, O. Dounaevsky and E. Shoshan
IET Circuits, Devices and Systems, Vol.5(1), pp.8-20
Jan/2011
url
https://doi.org/10.1049/iet-cds.2010.0147View
Published (Version of record) Restricted

Abstract

Details

Metrics

5 Record Views