SPM tip visualization through deconvolution using various characterizers: Optimization of the protocol for obtaining true surface topography from experimentally acquired images

In recent years, a variety of methodologies and samples have been proposed for removing the effect of tip shape from scanning probe microscope (SPM) images. Despite the importance of such procedures in obtaining accurate representation of the surface topography, they are not generally applied, nor have they become readily available to the average SPM user. This paper contrasts the two major categories of methodology for extracting the tip shape and subsequently eroding this shape from an image. Several commonly available samples are used as examples and/or proposed as standards. It is seen that the unique considerations of a specific measurement will guide which protocols are used, and that misdirected application of the techniques can give misleading results.